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Power-Aware Testing and Test Strategies for Low Power Devices

by Patrick Girard,Nicola Nicolici,Xiaoqing Wen

ISBN 13: 9781489983138

Format: Paperback (388 pages)
Publisher: Springer
Published: 05 Sep 2014

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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

by Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel

ISBN 13: 9781489983145

Format: Paperback (188 pages)
Publisher: Springer
Published: 03 Sep 2014

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